Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4794
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dc.contributor.authorSoussan, P.-
dc.contributor.authorLEKENS, Geert-
dc.contributor.authorDREESEN, Raf-
dc.contributor.authorDE CEUNINCK, Ward-
dc.contributor.authorBeyne, E.-
dc.date.accessioned2007-12-20T15:52:45Z-
dc.date.available2007-12-20T15:52:45Z-
dc.date.issued2003-
dc.identifier.citationProceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003.-
dc.identifier.urihttp://hdl.handle.net/1942/4794-
dc.language.isoen-
dc.titleAdvantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices-
dc.typeProceedings Paper-
local.bibliographicCitation.conferencedate6-10 October 2003-
local.bibliographicCitation.conferencenameEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003)-
dc.bibliographicCitation.conferencenr14-
local.bibliographicCitation.conferenceplaceBordeaux-Arcachon, France-
local.bibliographicCitation.jcatC2-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcatC2-
local.bibliographicCitation.btitleProceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003-
item.accessRightsClosed Access-
item.fullcitationSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward & Beyne, E. (2003) Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices. In: Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003..-
item.contributorSoussan, P.-
item.contributorLEKENS, Geert-
item.contributorDREESEN, Raf-
item.contributorDE CEUNINCK, Ward-
item.contributorBeyne, E.-
item.fulltextNo Fulltext-
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