Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/4794Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Soussan, P. | - |
| dc.contributor.author | LEKENS, Geert | - |
| dc.contributor.author | DREESEN, Raf | - |
| dc.contributor.author | DE CEUNINCK, Ward | - |
| dc.contributor.author | Beyne, E. | - |
| dc.date.accessioned | 2007-12-20T15:52:45Z | - |
| dc.date.available | 2007-12-20T15:52:45Z | - |
| dc.date.issued | 2003 | - |
| dc.identifier.citation | Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003. | - |
| dc.identifier.uri | http://hdl.handle.net/1942/4794 | - |
| dc.language.iso | en | - |
| dc.title | Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices | - |
| dc.type | Proceedings Paper | - |
| local.bibliographicCitation.conferencedate | 6-10 October 2003 | - |
| local.bibliographicCitation.conferencename | European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003) | - |
| dc.bibliographicCitation.conferencenr | 14 | - |
| local.bibliographicCitation.conferenceplace | Bordeaux-Arcachon, France | - |
| local.bibliographicCitation.jcat | C2 | - |
| local.type.specified | Proceedings Paper | - |
| dc.bibliographicCitation.oldjcat | C2 | - |
| local.bibliographicCitation.btitle | Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003 | - |
| item.contributor | Soussan, P. | - |
| item.contributor | LEKENS, Geert | - |
| item.contributor | DREESEN, Raf | - |
| item.contributor | DE CEUNINCK, Ward | - |
| item.contributor | Beyne, E. | - |
| item.fullcitation | Soussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward & Beyne, E. (2003) Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices. In: Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003.. | - |
| item.accessRights | Closed Access | - |
| item.fulltext | No Fulltext | - |
| Appears in Collections: | Research publications | |
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