Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/48039
Title: Direct ALD of amorphous MoS2 thin films for extra-terrestrial photovoltaic applications
Authors: HAMTAEI, Sarallah 
Sungjoon, Kim
Nazif, Koosha Nassiri
Nattoo, Crystal
Carr, Joshua M.
Romanetz, Leo
Nitta, Frederick U.
Reid, Obadia G.
VERMANG, Bart 
Elam, Jeffery
Pop, Eric
Issue Date: 2025
Publisher: IEEE
Source: 2025 IEEE 53RD Photovoltaic specialist conference, PVSC, IEEE, p. 1472
Series/Report: IEEE Photovoltaic Specialists Conference
Abstract: The design of solar cells for space applications demands a high power-to-weight ratio and resilience against extreme environments, including proton radiation and rapid temperature fluctuations. However, existing technologies come with drawbacks: III-V materials are expensive, CdTe and CIGS rely on scarce and toxic elements, perovskites suffer from stability issues, and silicon has limited limited tolerance to space-stressors. This study investigates ultra-thin amorphous MoS2 as a viable alternative, offering a balance of affordability, environmental sustainability, and robustness. Using atomic layer deposition (ALD), we enable scalable production of photovoltaic-grade amorphous MoS2 thin films, achieving large-area coatings with exceptional uniformity, smoothness, and precise thickness control. Passivation increases the charge carrier lifetime to approximately 100 ns, highlighting the potential for high specific power in a fully encapsulated module. Additionally, unpassivated films show minimal disorder when exposed to high-energy, high-fluence proton radiation. These results highlight the promise of amorphous MoS2 for space-based photovoltaics and lay the groundwork for further studies on its long-term durability in extraterrestrial conditions.
Notes: Hamtaei, S (corresponding author), Stanford Univ, Stanford, CA 94305 USA.
Document URI: http://hdl.handle.net/1942/48039
ISBN: 979-8-3315-3445-5; 979-8-3315-3444-8
DOI: 10.1109/PVSC59419.2025.11133148
ISI #: 001572091100513
Category: C1
Type: Proceedings Paper
Appears in Collections:Research publications

Files in This Item:
File Description SizeFormat 
IEEE Xplore Full-Text PDF_.pdfPublished version556.76 kBAdobe PDFView/Open
Show full item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.