Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/49573
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dc.contributor.authorVANOPPEN, Gijs-
dc.contributor.authorHOOYBERGHS, Jef-
dc.contributor.authorDEFERME, Wim-
dc.contributor.authorCLEUREN, Bart-
dc.date.accessioned2026-07-10T12:09:27Z-
dc.date.available2026-07-10T12:09:27Z-
dc.date.issued2026-
dc.date.submitted2026-07-10T12:03:51Z-
dc.identifier.citationPhysica Status Solidi A-applications and Materials Science, 223 (12) (Art N° e70408)-
dc.identifier.urihttp://hdl.handle.net/1942/49573-
dc.description.abstractMetallic nanoring networks can serve as promising flexible transparent electrodes. These materials are crucial components in a wide range of applications, including solar cells, touchscreens, and displays. In this work, a computational investigation considers in detail (i) the electrical conductance and optical performance of nanoring networks and (ii) the breakdown of these networks due to electrical damage. The electrical resistance of both the nanorings and the contacts between the rings (junctions) is taken into account. In part (i), the effects of five parameters on the electrical sheet resistance and optical transparency are presented. It is shown that several parameter combinations achieve better performance in comparison to indium tin oxide, currently the most widely used transparent electrode. In part (ii), due to electrical damage, the nanoring systems display the formation of a crack, running parallel to the vertical terminals, where a voltage difference is applied. The network degradation is measured by its sheet resistance, and a universal effect is observed: networks with varying filling factors exhibit the same degradation profile.-
dc.description.sponsorshipFunding This study was supported by the Special Research Fund (BOF) of Hasselt University (BOF24OWB29) and VSC (Flemish Supercomputer Center), funded by the Research Foundation - Flanders (FWO) and the Flemish Government. Acknowledgments This study was supported by the Special Research Fund (BOF) of Hasselt University using BOF number BOF24OWB29. The resources and services used in this work were provided by the VSC (Flemish Supercomputer Center), funded by the Research Foundation - Flanders (FWO) and the Flemish Government.-
dc.language.isoen-
dc.publisherWILEY-V C H VERLAG GMBH-
dc.rights2026 Wiley-VCH GmbH.-
dc.subject.otherelectrical breakdown-
dc.subject.otherelectrical properties-
dc.subject.othermetal nanowire electrodes-
dc.subject.othernanoring networks-
dc.subject.otherpercolation-
dc.subject.othertransparent flexible electrodes-
dc.titlePerformance of Nanoring-Based Transparent Conductors: A Computational Investigation-
dc.typeJournal Contribution-
dc.identifier.issue12-
dc.identifier.volume223-
local.format.pages11-
local.bibliographicCitation.jcatA1-
dc.description.notesCleuren, B (corresponding author), UHasselt, Fac Sci, Theory Lab, Diepenbeek, Belgium.-
dc.description.notesbart.cleuren@uhasselt.be-
local.publisher.placePOSTFACH 101161, 69451 WEINHEIM, GERMANY-
local.type.refereedRefereed-
local.type.specifiedArticle-
local.bibliographicCitation.artnre70408-
local.type.programmeVSC-
dc.identifier.doi10.1002/pssa.70408-
dc.identifier.isi001797980500001-
local.provider.typewosris-
local.description.affiliation[Vanoppen, Gijs; Cleuren, Bart] UHasselt, Fac Sci, Theory Lab, Diepenbeek, Belgium.-
local.description.affiliation[Hooyberghs, Jef] UHasselt, Data Sci Inst, Theory Lab, Diepenbeek, Belgium.-
local.description.affiliation[Deferme, Wim] UHasselt, Inst Mat Res IUMAT, Hasselt, Belgium.-
local.description.affiliation[Deferme, Wim] IMEC, IUMAT, Diepenbeek, Belgium.-
local.dataset.doi10.5281/zenodo.20125324-
local.dataset.urlhttp://hdl.handle.net/1942/49574-
local.uhasselt.internationalno-
item.contributorVANOPPEN, Gijs-
item.contributorHOOYBERGHS, Jef-
item.contributorDEFERME, Wim-
item.contributorCLEUREN, Bart-
item.accessRightsRestricted Access-
item.fullcitationVANOPPEN, Gijs; HOOYBERGHS, Jef; DEFERME, Wim & CLEUREN, Bart (2026) Performance of Nanoring-Based Transparent Conductors: A Computational Investigation. In: Physica Status Solidi A-applications and Materials Science, 223 (12) (Art N° e70408).-
item.fulltextWith Fulltext-
crisitem.journal.issn0031-8965-
crisitem.journal.eissn1862-6319-
Appears in Collections:Research publications
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