Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/49924
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dc.contributor.authorSchölzel, Franziska-
dc.contributor.authorNarudin, Arina-
dc.contributor.authorCiesielska, Aleksandra-
dc.contributor.authorEhm, Alexander-
dc.contributor.authorZahn, Dietrich R. T.-
dc.contributor.authorVAN GOMPEL, Wouter-
dc.contributor.authorKahmann, Simon-
dc.contributor.authorSalvan, Georgeta-
dc.date.accessioned2026-08-27T13:26:12Z-
dc.date.available2026-08-27T13:26:12Z-
dc.date.issued2026-
dc.date.submitted2026-08-26T15:13:08Z-
dc.identifier.citationApplied physics letters, 129 (8) (Art N° 080501)-
dc.identifier.urihttp://hdl.handle.net/1942/49924-
dc.description.abstractCircular Dichroism (CD) spectroscopy has evolved from a purely solution based method towards an important tool in the analysis of chiral thin films. Although a straightforward technique, the true CD signal is often accompanied by artifacts arising from optical anisotropy and instrumental imperfections. Here, we present a two-step workflow that separates the orientation invariant CD response for anisotropic thin films by combining az-imuthal sample rotation with sample flipping. For this purpose, a home-built sample stage was developed, which enables systematic suppression of many anisotropy-induced artifacts in commercial CD spectrophotometers. Both a detailed description of the setup itself as well as the required python script are provided. The reliability of the workflow is demonstrated on two selected samples from different research fields: chiral molecules attached to metallic surfaces as well as low-dimensional metal halide perovskites incorporating chiral spacer molecules.-
dc.description.sponsorshipF.S. and G.S. gratefully acknowledge funding through the German Research Foundation (DFG), TRR 386, TP B3, Project No. 514664767. This project was co-financed by the European Union and by tax funds in accordance with the budget adopted by the Saxon state parliament (EFRE InfraProNet 2021–2027 NachLeuchten 100701886 and 100701890). The authors thank Axel Fechner and Volker Krauß for their help with the construction of the rotation stage. Furthermore, F.S. and G.S. would like to thank the group of Professor Thomas Seyller (TU Chemnitz) for the opportunity to use their AFM and the Center of Micro and Nanotechnologies (TU Chemnitz) for the deposition of the Au films. A.C. acknowledges the Research Foundation—Flanders (FWO) for the funding of her FWO strategic basic research Ph.D. grant (1SH0X24N). W.T.M.V.G. acknowledges the FWO for the funding of the WEAVE project INTENSITY (G0AQV25N). A.E. and D.R.T.Z. gratefully acknowledge funding by the DFG Research Unit FOR 5387 POPULAR, Project No. 461909888.-
dc.language.isoen-
dc.publisherAIP-
dc.rightsPublished under an exclusive license by AIP Publishing-
dc.titleA step-by-step workflow to account for linear polarization artifacts in circular dichroism of thin films-
dc.typeJournal Contribution-
dc.identifier.issue8-
dc.identifier.volume129-
local.format.pages13-
local.bibliographicCitation.jcatA1-
local.type.refereedRefereed-
local.type.specifiedArticle-
local.bibliographicCitation.artnr080501-
dc.identifier.doi10.1063/5.0340813-
local.provider.typeCrossRef-
local.uhasselt.internationalyes-
item.fullcitationSchölzel, Franziska; Narudin, Arina; Ciesielska, Aleksandra; Ehm, Alexander; Zahn, Dietrich R. T.; VAN GOMPEL, Wouter; Kahmann, Simon & Salvan, Georgeta (2026) A step-by-step workflow to account for linear polarization artifacts in circular dichroism of thin films. In: Applied physics letters, 129 (8) (Art N° 080501).-
item.contributorSchölzel, Franziska-
item.contributorNarudin, Arina-
item.contributorCiesielska, Aleksandra-
item.contributorEhm, Alexander-
item.contributorZahn, Dietrich R. T.-
item.contributorVAN GOMPEL, Wouter-
item.contributorKahmann, Simon-
item.contributorSalvan, Georgeta-
item.embargoEndDate2027-03-01-
item.fulltextWith Fulltext-
item.accessRightsEmbargoed Access-
crisitem.journal.issn0003-6951-
crisitem.journal.eissn1077-3118-
Appears in Collections:Research publications
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