Raw data for manuscript "Disentangling ion migration from artifacts in high-fidelity ToF-SIMS depth profiling of perovskite solar cells"

Abstract

This record contains the raw data for the manuscript "Disentangling ion migration from artifacts in high-fidelity ToF-SIMS depth profiling of perovskite solar cells" (Joule 10, 102488 (2026); https://doi.org/10.1016/j.joule.2026.102488). This dataset is organized by figure number and contains ToF-SIMS data provided in both proprietary IONTOF formats (.itax, .itmx, and .itm) and the open-standard .imzML format. The supporting SEM and AFM data are also provided. Note: The compressed .zip is 38 GB, but requires approximately 320 GB of disk space once fully uncompressed. The pre-processed and exported depth profile data in plain text format (.txt) and the analysis code for complete reproduction of all manuscript figures is archived on Zenodo and hosted on GitHub.