Pre-processed and exported ToF-SIMS depth profile data and analysis code for manuscript "Disentangling ion migration from artifacts in high-fidelity ToF-SIMS depth profiling of perovskite solar cells"

Abstract

This record contains the pre-processed and exported ToF-SIMS depth profile data and reproducible analysis code for the manuscript "Disentangling ion migration from artifacts in high-fidelity ToF-SIMS depth profiling of perovskite solar cells" (Joule 10, 102488 (2026); https://doi.org/10.1016/j.joule.2026.102488). The included Jupyter Notebook (.ipynb) generates all manuscript figures directly from the exported plain-text (.txt) data files. While this code and pre-processed data are also hosted on GitHub, the complete raw data archive (containing both the proprietary IONTOF .itax, .itmx, and .itm and the open-standard .imzML formats), alongside supporting SEM and AFM data, is available on Zenodo.