Data on degradation in scalable wide-bandgap perovskite solar cells

Abstract

This work investigates degradation pathways in scalable wide-bandgap (1.68 eV) perovskite solar cells by comparing their performance under standardized accelerated stress conditions with 1.61 eV reference devices. Stress testing following ISOS protocols includes continuous light (ISOS-L1), thermal storage (ISOS-D2), and combined light/heat exposure (ISOS-L2). Light-only stressing produced limited performance loss over tens of hours, whereas thermal and combined stresses caused faster efficiency decay. The study attributes key failure modes either to interface-related transport barriers or to absorber degradation under combined stresses, underscoring the need for diversified stability testing.