PARION, Jonathan

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Full Name
PARION, Jonathan
Email
jonathan.parion@uhasselt.be
 
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Publications

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Issue DateTitleContributor(s)TypeCat.
12024Comparative study of the interface passivation properties of LiF and Al2O3 using silicon MIS capacitorPARION, Jonathan; SCAFFIDI, Romain; DUERINCKX, Filip; SIVARAMAKRISHNAN RADHAKRISHNAN, Hariharsudan; Flandre, Denis; POORTMANS, Jef; VERMANG, BartJournal ContributionA1
22023Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)2 thin-film solar cellsPARION, Jonathan; SCAFFIDI, Romain; Flandre, Denis; BRAMMERTZ, Guy; VERMANG, BartProceedings PaperC1