Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/5288
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | CZECH, I. | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.contributor.author | STALS, Lambert | - |
dc.contributor.author | Roggen, J. | - |
dc.contributor.author | Huyberechts, G. | - |
dc.date.accessioned | 2007-12-20T15:57:21Z | - |
dc.date.available | 2007-12-20T15:57:21Z | - |
dc.date.issued | 1996 | - |
dc.identifier.citation | Proceedings TAFT ""96: 5th international symposium on trends and new applications in thin films, 1-3 april, Colmar (France). p. 131-133. | - |
dc.identifier.uri | http://hdl.handle.net/1942/5288 | - |
dc.title | On the deposition and characterization of thin SnO2 films | - |
dc.type | Proceedings Paper | - |
dc.identifier.epage | 133 | - |
dc.identifier.spage | 131 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
local.bibliographicCitation.btitle | Proceedings TAFT ""96: 5th international symposium on trends and new applications in thin films, 1-3 april, Colmar (France) | - |
item.accessRights | Closed Access | - |
item.fulltext | No Fulltext | - |
item.contributor | CZECH, I. | - |
item.contributor | DE SCHEPPER, Luc | - |
item.contributor | STALS, Lambert | - |
item.contributor | Roggen, J. | - |
item.contributor | Huyberechts, G. | - |
item.fullcitation | CZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J. & Huyberechts, G. (1996) On the deposition and characterization of thin SnO2 films. In: Proceedings TAFT ""96: 5th international symposium on trends and new applications in thin films, 1-3 april, Colmar (France). p. 131-133.. | - |
Appears in Collections: | Research publications |
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