Please use this identifier to cite or link to this item:
|Title:||In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems||Authors:||MANCA, Jean
DE SCHEPPER, Luc
|Issue Date:||2003||Publisher:||MATERIALS RESEARCH SOCIETY||Source:||Blom, PWM & Greenham, NC & Dimitrakopoulos, CD & Frisbie, CD (Ed.) ORGANIC AND POLYMERIC MATERIALS AND DEVICES. p. 383-389.||Series/Report:||MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS||Series/Report no.:||771||Abstract:||In order to tailor the synthesis of new robust organic materials for electronic applications and to guarantee the required life time for the emerging commercial plastic electronic applications it is of key importance to understand the underlying degradation mechanisms. Since plastic electronics is a rather young technology introducing new material systems, its reliability is characterized by new failure and degradation mechanisms, a relatively high amount of early failures and multi-modal failure distributions. To understand the mechanism responsible for a given failure or degradation mode, it is essential to study it separately, through appropriate test structures and test techniques. Powerful techniques for this purpose are a.o. analytical techniques (SEM, TEM, SPM,..), in-situ electrical measurement techniques and spectroscopical techniques (in-situ FTIR, in-situ UV-Vis, PDS). The benefits of these in-situ techniques in the reliability study of organic based electronics will be illustrated in this contribution.||Document URI:||http://hdl.handle.net/1942/5294||ISBN:||1-55899-708-3||ISI #:||000185782000061||Category:||C1||Type:||Proceedings Paper||Validations:||ecoom 2004|
|Appears in Collections:||Research publications|
Show full item record
checked on May 19, 2022
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.