Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/5357
Full metadata record
DC FieldValueLanguage
dc.contributor.authorKNUYT, Gilbert-
dc.contributor.authorLAUWERENS, Walter-
dc.contributor.authorSTALS, Lambert-
dc.date.accessioned2007-12-20T15:57:59Z-
dc.date.available2007-12-20T15:57:59Z-
dc.date.issued2000-
dc.identifier.citationThin solid films, 370(1-2). p. 232-237-
dc.identifier.issn0040-6090-
dc.identifier.urihttp://hdl.handle.net/1942/5357-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.titleA unified theoretical model for tensile and compressive residual film stress-
dc.typeJournal Contribution-
dc.identifier.epage237-
dc.identifier.issue1-2-
dc.identifier.spage232-
dc.identifier.volume370-
local.bibliographicCitation.jcatA1-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/S0040-6090(00)00944-5-
dc.identifier.isi000087942200035-
item.fullcitationKNUYT, Gilbert; LAUWERENS, Walter & STALS, Lambert (2000) A unified theoretical model for tensile and compressive residual film stress. In: Thin solid films, 370(1-2). p. 232-237.-
item.accessRightsClosed Access-
item.validationecoom 2001-
item.fulltextNo Fulltext-
item.contributorKNUYT, Gilbert-
item.contributorLAUWERENS, Walter-
item.contributorSTALS, Lambert-
Appears in Collections:Research publications
Show simple item record

SCOPUSTM   
Citations

23
checked on Aug 22, 2025

WEB OF SCIENCETM
Citations

20
checked on Aug 25, 2025

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.