Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/5357
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dc.contributor.authorKNUYT, Gilbert-
dc.contributor.authorLAUWERENS, Walter-
dc.contributor.authorSTALS, Lambert-
dc.date.accessioned2007-12-20T15:57:59Z-
dc.date.available2007-12-20T15:57:59Z-
dc.date.issued2000-
dc.identifier.citationThin solid films, 370(1-2). p. 232-237-
dc.identifier.issn0040-6090-
dc.identifier.urihttp://hdl.handle.net/1942/5357-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.titleA unified theoretical model for tensile and compressive residual film stress-
dc.typeJournal Contribution-
dc.identifier.epage237-
dc.identifier.issue1-2-
dc.identifier.spage232-
dc.identifier.volume370-
local.bibliographicCitation.jcatA1-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/S0040-6090(00)00944-5-
dc.identifier.isi000087942200035-
item.fulltextNo Fulltext-
item.validationecoom 2001-
item.accessRightsClosed Access-
item.fullcitationKNUYT, Gilbert; LAUWERENS, Walter & STALS, Lambert (2000) A unified theoretical model for tensile and compressive residual film stress. In: Thin solid films, 370(1-2). p. 232-237.-
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