Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/5507
Title: Low-level optical absorption phenomena in organic thin films for solar cell applications investigated by high sensitive photocurrent and photothermal techniques
Authors: GORIS, Ludwig 
HAENEN, Ken 
NESLADEK, Milos 
Poruba, A.
Vanecek, M.
WAGNER, Patrick 
LUTSEN, Laurence 
MANCA, Jean 
VANDERZANDE, Dirk 
DE SCHEPPER, Luc 
Issue Date: 2004
Publisher: SPIE
Source: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE): vol. 5464. p. 372-381.
Abstract: Optical absorption phenomena and in particular sub band gap absorption features are of great importance in the understanding of processes of charge generation and transport in organic pure and composite semiconductor films. To come towards this objective, an alternative and high sensitive spectroscopic approach is introduced to examine the absorption of light in pure and compound organic semiconductors. Because sub band gap absorption features are typically characterized by very low absorption coefficients, it is not possible to resolve them using common transmission and reflection measurements and high sensitive alternatives are needed. Therefore, a combination of photocurrent (Constant Photocurrent Method CPM/Fourier Transform Photocurrent Spectroscopy FT-PS) and photothermal techniques (Photothermal Deflection Spectroscopy PDS) has been used, increasing sensitivity by a factor of thousand, reaching detectable absorption coefficients (E) down to 0.1 cm(-1). In this way, the dynamic range of measurable absorption coefficients is increased by several orders of magnitude compared to transmission/reflection measurements. These techniques have been used here to characterize ground state absorption of thin films of MDMO-PPV, PCBM and a mixture of both materials in a 1:4 ratio, as typically used in a standard active layer in a fully organic solar cell. The spectra reveal defect related absorption phenomena and significant indication of existing interaction in the ground state between both materials, contrary to the widely spread conviction that this is not the case. Experimental details of the techniques and measurement procedures are explained.
Document URI: http://hdl.handle.net/1942/5507
ISBN: 0-8194-5387-0
DOI: 10.1117/12.547276
ISI #: 000224432800044
Category: C1
Type: Proceedings Paper
Validations: ecoom 2005
Appears in Collections:Research publications

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