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http://hdl.handle.net/1942/5719
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | DE CEUNINCK, Ward | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.contributor.author | STALS, Lambert | - |
dc.contributor.author | d' Haeger, V. | - |
dc.date.accessioned | 2007-12-20T16:01:26Z | - |
dc.date.available | 2007-12-20T16:01:26Z | - |
dc.date.issued | 1996 | - |
dc.identifier.citation | Proceedings of the Materials Research Symposium, San Diego (USA), 9-12 April 1996. p. 133-140. | - |
dc.identifier.uri | http://hdl.handle.net/1942/5719 | - |
dc.title | Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperature | - |
dc.type | Proceedings Paper | - |
dc.identifier.epage | 140 | - |
dc.identifier.spage | 133 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
local.bibliographicCitation.btitle | Proceedings of the Materials Research Symposium, San Diego (USA), 9-12 April 1996 | - |
item.fullcitation | DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert & d' Haeger, V. (1996) Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperature. In: Proceedings of the Materials Research Symposium, San Diego (USA), 9-12 April 1996. p. 133-140.. | - |
item.accessRights | Closed Access | - |
item.contributor | DE CEUNINCK, Ward | - |
item.contributor | DE SCHEPPER, Luc | - |
item.contributor | STALS, Lambert | - |
item.contributor | d' Haeger, V. | - |
item.fulltext | No Fulltext | - |
Appears in Collections: | Research publications |
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