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http://hdl.handle.net/1942/6906
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | VLEKKEN, Johan | - |
dc.contributor.author | POLUS, Dany | - |
dc.contributor.author | D'OLIESLAEGER, Marc | - |
dc.contributor.author | Vandervorst, W. | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.date.accessioned | 2007-12-20T16:11:27Z | - |
dc.date.available | 2007-12-20T16:11:27Z | - |
dc.date.issued | 2000 | - |
dc.identifier.citation | SIMS XII: Secondary Ion Mass Spectrsoscopy, Brussels. p. 341-344. | - |
dc.identifier.uri | http://hdl.handle.net/1942/6906 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS) | - |
dc.type | Proceedings Paper | - |
local.bibliographicCitation.conferencedate | 2000 | - |
local.bibliographicCitation.conferencename | 12th International Conference on Secondary Ion Mass Spectrometry | - |
local.bibliographicCitation.conferenceplace | Brussel, Belgium | - |
dc.identifier.epage | 344 | - |
dc.identifier.spage | 341 | - |
local.bibliographicCitation.jcat | C2 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | C2 | - |
local.bibliographicCitation.btitle | SIMS XII: Secondary Ion Mass Spectrsoscopy, Brussels | - |
item.fulltext | No Fulltext | - |
item.accessRights | Closed Access | - |
item.fullcitation | VLEKKEN, Johan; POLUS, Dany; D'OLIESLAEGER, Marc; Vandervorst, W. & DE SCHEPPER, Luc (2000) Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS). In: SIMS XII: Secondary Ion Mass Spectrsoscopy, Brussels. p. 341-344.. | - |
item.contributor | VLEKKEN, Johan | - |
item.contributor | POLUS, Dany | - |
item.contributor | D'OLIESLAEGER, Marc | - |
item.contributor | Vandervorst, W. | - |
item.contributor | DE SCHEPPER, Luc | - |
Appears in Collections: | Research publications |
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