Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/704
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dc.contributor.authorGEERTS, Floris-
dc.contributor.authorGOETHALS, Bart-
dc.contributor.authorVAN DEN BUSSCHE, Jan-
dc.date.accessioned2005-04-11T13:42:53Z-
dc.date.available2005-04-11T13:42:53Z-
dc.date.issued2001-
dc.identifier.citationCercone, N. (Ed.) IEEE INTERNATIONAL CONFERENCE ON DATA MINING. PROCEEDINGS. p. 155-162.-
dc.identifier.isbn0-7695-1119-8-
dc.identifier.urihttp://hdl.handle.net/1942/704-
dc.description.abstractIn the context of mining for frequent patterns using the standard levelwise algorithm, the following question arises: given the current level and the current set of frequent patterns, what is the maximal number of candidate patterns that can be generated on the next level? We answer this question by providing a tight upper bound, derived from a combinatorial result from the sixties by Kruskal and Katona. Our result is useful to reduce the number of database scans.-
dc.format.extent247125 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoen-
dc.publisherIEEE Computer Society-
dc.titleA Tight Upper Bound on the Number of Candidate Patterns-
dc.typeProceedings Paper-
local.bibliographicCitation.authorsCercone, N.-
local.bibliographicCitation.conferencedate2001-
local.bibliographicCitation.conferencenameIEEE INTERNATIONAL CONFERENCE ON DATA MINING. PROCEEDINGS-
dc.identifier.epage162-
dc.identifier.spage155-
local.bibliographicCitation.jcatC1-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcatC1-
dc.identifier.isi000173158200020-
local.bibliographicCitation.btitleIEEE INTERNATIONAL CONFERENCE ON DATA MINING. PROCEEDINGS-
item.accessRightsOpen Access-
item.contributorGEERTS, Floris-
item.contributorGOETHALS, Bart-
item.contributorVAN DEN BUSSCHE, Jan-
item.fullcitationGEERTS, Floris; GOETHALS, Bart & VAN DEN BUSSCHE, Jan (2001) A Tight Upper Bound on the Number of Candidate Patterns. In: Cercone, N. (Ed.) IEEE INTERNATIONAL CONFERENCE ON DATA MINING. PROCEEDINGS. p. 155-162..-
item.validationecoom 2003-
item.fulltextWith Fulltext-
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