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http://hdl.handle.net/1942/7225
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | DREESEN, Raf | - |
dc.contributor.author | DE CEUNINCK, Ward | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.contributor.author | Groeseneken, G. | - |
dc.date.accessioned | 2007-12-20T16:14:13Z | - |
dc.date.available | 2007-12-20T16:14:13Z | - |
dc.date.issued | 1997 | - |
dc.identifier.citation | Proceedings of the 8th European symposium on reliability of electron devices, failure physics and analysis. p. 1533-1536. | - |
dc.identifier.uri | http://hdl.handle.net/1942/7225 | - |
dc.language.iso | en | - |
dc.title | A high resolution method for measuring hot carrier degradation in matched transistor pairs | - |
dc.type | Proceedings Paper | - |
local.bibliographicCitation.conferencename | European symposium on reliability of electron devices, failure physics and analysis | - |
dc.bibliographicCitation.conferencenr | 8 | - |
dc.identifier.epage | 1536 | - |
dc.identifier.issue | 10/11 | - |
dc.identifier.spage | 1533 | - |
dc.identifier.volume | 37 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
local.bibliographicCitation.btitle | Proceedings of the 8th European symposium on reliability of electron devices, failure physics and analysis | - |
item.accessRights | Closed Access | - |
item.fulltext | No Fulltext | - |
item.contributor | DREESEN, Raf | - |
item.contributor | DE CEUNINCK, Ward | - |
item.contributor | DE SCHEPPER, Luc | - |
item.contributor | Groeseneken, G. | - |
item.fullcitation | DREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc & Groeseneken, G. (1997) A high resolution method for measuring hot carrier degradation in matched transistor pairs. In: Proceedings of the 8th European symposium on reliability of electron devices, failure physics and analysis. p. 1533-1536.. | - |
Appears in Collections: | Research publications |
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