Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/7230
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dc.contributor.authorSegers, D.-
dc.contributor.authorParidaens, J.-
dc.contributor.authorvan Hoecke, T.-
dc.contributor.authorDauwe, C.-
dc.contributor.authorDorikens-Vanpraet, L.-
dc.contributor.authorQUAEYHAEGENS, Carl-
dc.contributor.authorSTALS, Lambert-
dc.date.accessioned2007-12-20T16:14:16Z-
dc.date.available2007-12-20T16:14:16Z-
dc.date.issued1995-
dc.identifier.citationApplied surface science, 85. p. 172-177-
dc.identifier.urihttp://hdl.handle.net/1942/7230-
dc.description.abstractAll the LINAC-based slow positron beams are pulsed. In order to perform Doppler broadening measurements one needs a continuous distribution of the slow positron intensity. This intensity has to be kept as constant as possible. A smearing out of the positron intensity with a Penning trap is described. The first depth profiling results are presented.-
dc.language.isoen-
dc.publisherElsevier Science B.V.-
dc.titlePositron Doppler broadening measurements with LINAC-based slow positron beam-
dc.typeJournal Contribution-
dc.identifier.epage177-
dc.identifier.spage172-
dc.identifier.volume85-
dc.bibliographicCitation.oldjcat-
dc.identifier.doi10.1016/0169-4332(94)00328-9-
item.fulltextNo Fulltext-
item.contributorSegers, D.-
item.contributorParidaens, J.-
item.contributorvan Hoecke, T.-
item.contributorDauwe, C.-
item.contributorDorikens-Vanpraet, L.-
item.contributorQUAEYHAEGENS, Carl-
item.contributorSTALS, Lambert-
item.fullcitationSegers, D.; Paridaens, J.; van Hoecke, T.; Dauwe, C.; Dorikens-Vanpraet, L.; QUAEYHAEGENS, Carl & STALS, Lambert (1995) Positron Doppler broadening measurements with LINAC-based slow positron beam. In: Applied surface science, 85. p. 172-177.-
item.accessRightsClosed Access-
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