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http://hdl.handle.net/1942/7237
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | VLEKKEN, Johan | - |
dc.contributor.author | CROES, Kristof | - |
dc.contributor.author | D'OLIESLAEGER, Marc | - |
dc.contributor.author | KNUYT, Gilbert | - |
dc.contributor.author | Vandervorst, W. | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.date.accessioned | 2007-12-20T16:14:20Z | - |
dc.date.available | 2007-12-20T16:14:20Z | - |
dc.date.issued | 1998 | - |
dc.identifier.citation | Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 931-934. | - |
dc.identifier.uri | http://hdl.handle.net/1942/7237 | - |
dc.publisher | Chichester Wiley 1998 | - |
dc.title | Investigation of correlations between parameters defining the state of sputtered particles | - |
dc.type | Proceedings Paper | - |
dc.identifier.epage | 934 | - |
dc.identifier.spage | 931 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
local.bibliographicCitation.btitle | Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997) | - |
item.accessRights | Closed Access | - |
item.contributor | VLEKKEN, Johan | - |
item.contributor | CROES, Kristof | - |
item.contributor | D'OLIESLAEGER, Marc | - |
item.contributor | KNUYT, Gilbert | - |
item.contributor | Vandervorst, W. | - |
item.contributor | DE SCHEPPER, Luc | - |
item.fulltext | No Fulltext | - |
item.fullcitation | VLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W. & DE SCHEPPER, Luc (1998) Investigation of correlations between parameters defining the state of sputtered particles. In: Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 931-934.. | - |
Appears in Collections: | Research publications |
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