Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/7237
Full metadata record
DC FieldValueLanguage
dc.contributor.authorVLEKKEN, Johan-
dc.contributor.authorCROES, Kristof-
dc.contributor.authorD'OLIESLAEGER, Marc-
dc.contributor.authorKNUYT, Gilbert-
dc.contributor.authorVandervorst, W.-
dc.contributor.authorDE SCHEPPER, Luc-
dc.date.accessioned2007-12-20T16:14:20Z-
dc.date.available2007-12-20T16:14:20Z-
dc.date.issued1998-
dc.identifier.citationProceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 931-934.-
dc.identifier.urihttp://hdl.handle.net/1942/7237-
dc.publisherChichester Wiley 1998-
dc.titleInvestigation of correlations between parameters defining the state of sputtered particles-
dc.typeProceedings Paper-
dc.identifier.epage934-
dc.identifier.spage931-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcat-
local.bibliographicCitation.btitleProceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997)-
item.contributorVLEKKEN, Johan-
item.contributorCROES, Kristof-
item.contributorD'OLIESLAEGER, Marc-
item.contributorKNUYT, Gilbert-
item.contributorVandervorst, W.-
item.contributorDE SCHEPPER, Luc-
item.accessRightsClosed Access-
item.fullcitationVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W. & DE SCHEPPER, Luc (1998) Investigation of correlations between parameters defining the state of sputtered particles. In: Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, USA, 7-12 September 1997). p. 931-934..-
item.fulltextNo Fulltext-
Appears in Collections:Research publications
Show simple item record

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.