Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/7288
Full metadata record
DC FieldValueLanguage
dc.contributor.authorAERTS, Marc-
dc.contributor.authorCLAESKENS, Gerda-
dc.contributor.authorHART, Jeffrey-
dc.contributor.authorMOONS, Elke-
dc.contributor.authorWETS, Geert-
dc.date.accessioned2007-12-20T16:14:46Z-
dc.date.available2007-12-20T16:14:46Z-
dc.date.issued2003-
dc.identifier.citationVerbeke, G. & Molenberghs, G. & Aerts, M. & Fieuws, S. (Ed.) Proceedings of the 18th International Workshop on Statistical Modelling. p. 15-20.-
dc.identifier.urihttp://hdl.handle.net/1942/7288-
dc.description.abstractSeveral methods have been developed to assess the fit of a regression model. Many lack of fit tests however focus on the simple regression setting. Here we propose two tests which are completely different in nature, but which both are promising especially in the case of a multiple regression model with several potential explanatory variables.-
dc.language.isoen-
dc.publisherLeuven : KUL-
dc.subject.otherBayes information criterion; classification trees; lack of fit; posterior distribution; recursive partitioning-
dc.titleTwo lack of fit tests for multiple logistic regression-
dc.typeProceedings Paper-
local.bibliographicCitation.authorsVerbeke, G.-
local.bibliographicCitation.authorsMolenberghs, G.-
local.bibliographicCitation.authorsAerts, M.-
local.bibliographicCitation.authorsFieuws, S.-
local.bibliographicCitation.conferencename18th International Workshop on Statistical Modelling-
local.bibliographicCitation.conferenceplaceBelgium : Leuven-
dc.identifier.epage20-
dc.identifier.spage15-
local.bibliographicCitation.jcatC2-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcatC2-
local.bibliographicCitation.btitleProceedings of the 18th International Workshop on Statistical Modelling-
item.fullcitationAERTS, Marc; CLAESKENS, Gerda; HART, Jeffrey; MOONS, Elke & WETS, Geert (2003) Two lack of fit tests for multiple logistic regression. In: Verbeke, G. & Molenberghs, G. & Aerts, M. & Fieuws, S. (Ed.) Proceedings of the 18th International Workshop on Statistical Modelling. p. 15-20..-
item.contributorAERTS, Marc-
item.contributorCLAESKENS, Gerda-
item.contributorHART, Jeffrey-
item.contributorMOONS, Elke-
item.contributorWETS, Geert-
item.fulltextNo Fulltext-
item.accessRightsClosed Access-
Appears in Collections:Research publications
Show simple item record

Page view(s)

48
checked on Jun 7, 2023

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.