Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/7420
Title: | Morphology of MDMO-PPV: PCBM bulk hetero-junction organic solar cells studied by AFM, KFM and TEM | Authors: | MARTENS, Tom BEELEN, Zjef D'HAEN, Jan MUNTERS, Tom GORIS, Ludwig MANCA, Jean D'OLIESLAEGER, Marc VANDERZANDE, Dirk DE SCHEPPER, Luc Andriessen, Ronn |
Issue Date: | 2003 | Publisher: | SPIE-INT SOCIETY OPTICAL ENGINEERING | Source: | Kafafi, ZH (Ed.) ORGANIC PHOTOVOLTAICS III. p. 40-47. | Series/Report: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | Series/Report no.: | 4801 | Abstract: | The microstructure of MDMO-PPV:PCBM blends as used in bulk hetero-junction organic solar cells was studied by Atomic Force Microscopy (AFM) and Kelvin Force Microscopy (KFM) to image the surface morphology and by means of Transmission Electron Microscopy (TEM) to reveal images of the film's interior. By introducing KFM, it was possible to demonstrate that phase separated domains have different local electrical properties than the surrounding matrix. Since blend morphology clearly influences global electrical properties and photovoltaic performance, an attempt to control the morphology by means of casting conditions was undertaken. By using AFM, it has been proven that not only the choice of solvent, but also drying conditions dramatically influence the blend structure. Therefore, the possibility of discovering the blend morphology by AFM, KFM and TEM makes them powerful tools for understanding today's organic photovoltaic performances and for screening new sets of materials. | Document URI: | http://hdl.handle.net/1942/7420 | ISBN: | 0-8194-4569-X | ISI #: | 000182159100006 | Category: | C1 | Type: | Proceedings Paper | Validations: | ecoom 2004 |
Appears in Collections: | Research publications |
Show full item record
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.