Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/8140
Title: A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiers
Authors: PETERSEN, Rainer 
DE CEUNINCK, Ward 
DE SCHEPPER, Luc 
Issue Date: 2000
Publisher: I E E E
Source: 2000 HIGH FREQUENCY POSTGRADUATE STUDENT COLLOQUIUM. p. 20-25.
Abstract: Thermal resistance measurements on MMIC amplifier modules are demonstrated where the present capacitive biasing network rendered the application of classical methods relying on the gate forward voltage characteristics not feasible. It has been found that employing the drain current as temperature sensitive measurement parameter is much less sensitive to switching transients as only voltage sources are applied Another important benefit of the drain current method is that untypical operating conditions and possible gate damage are avoided. The method has been applied to flight modules for satellite X-band amplifiers, where no modification of the final devices for measurement purposes could be tolerated.
Notes: Limburgs Univ Ctr, Inst Mat Oderzoek, Diepenbeek, B-3590 Belgium.Petersen, R, Limburgs Univ Ctr, Inst Mat Oderzoek, Wetenschapspk 1, Diepenbeek, B-3590 Belgium.
Document URI: http://hdl.handle.net/1942/8140
ISBN: 0-7803-6590-9
ISI #: 000166445200004
Category: C1
Type: Proceedings Paper
Validations: ecoom 2002
Appears in Collections:Research publications

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