Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/8143
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dc.contributor.authorCZECH, Jan-
dc.contributor.authorMANCA, Jean-
dc.contributor.authorRoggen J-
dc.contributor.authorHuyberechts G-
dc.contributor.authorSTALS, Lambert-
dc.contributor.authorDE SCHEPPER, Luc-
dc.date.accessioned2008-04-07T09:07:26Z-
dc.date.available2008-04-07T09:07:26Z-
dc.date.issued1996-
dc.identifier.citationICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS. p. 99-103.-
dc.identifier.isbn0-7803-2783-7-
dc.identifier.urihttp://hdl.handle.net/1942/8143-
dc.language.isoen-
dc.publisherI E E E-
dc.titleElectrical characterisation and reliability studies of thick film gas sensor structures.-
dc.typeProceedings Paper-
local.bibliographicCitation.conferencedateMAR 25-28, 1996-
local.bibliographicCitation.conferencename1996 IEEE International Conference on Microelectronic Test Structures (ICMTS 1996)-
local.bibliographicCitation.conferenceplaceTRENT, ITALY-
dc.identifier.epage103-
dc.identifier.spage99-
local.format.pages5-
dc.description.notesLIMBURGS UNIV CENTRUM, INST MAT RES, DIV MAT PHYS, DIEPENBEEK, B-3590 BELGIUM.-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
dc.bibliographicCitation.oldjcat-
dc.identifier.isiA1996BG12J00018-
local.bibliographicCitation.btitleICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS-
item.fulltextNo Fulltext-
item.contributorCZECH, Jan-
item.contributorMANCA, Jean-
item.contributorRoggen J-
item.contributorHuyberechts G-
item.contributorSTALS, Lambert-
item.contributorDE SCHEPPER, Luc-
item.fullcitationCZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert & DE SCHEPPER, Luc (1996) Electrical characterisation and reliability studies of thick film gas sensor structures.. In: ICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS. p. 99-103..-
item.accessRightsClosed Access-
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