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http://hdl.handle.net/1942/8143
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | CZECH, Jan | - |
dc.contributor.author | MANCA, Jean | - |
dc.contributor.author | Roggen J | - |
dc.contributor.author | Huyberechts G | - |
dc.contributor.author | STALS, Lambert | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.date.accessioned | 2008-04-07T09:07:26Z | - |
dc.date.available | 2008-04-07T09:07:26Z | - |
dc.date.issued | 1996 | - |
dc.identifier.citation | ICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS. p. 99-103. | - |
dc.identifier.isbn | 0-7803-2783-7 | - |
dc.identifier.uri | http://hdl.handle.net/1942/8143 | - |
dc.language.iso | en | - |
dc.publisher | I E E E | - |
dc.title | Electrical characterisation and reliability studies of thick film gas sensor structures. | - |
dc.type | Proceedings Paper | - |
local.bibliographicCitation.conferencedate | MAR 25-28, 1996 | - |
local.bibliographicCitation.conferencename | 1996 IEEE International Conference on Microelectronic Test Structures (ICMTS 1996) | - |
local.bibliographicCitation.conferenceplace | TRENT, ITALY | - |
dc.identifier.epage | 103 | - |
dc.identifier.spage | 99 | - |
local.format.pages | 5 | - |
dc.description.notes | LIMBURGS UNIV CENTRUM, INST MAT RES, DIV MAT PHYS, DIEPENBEEK, B-3590 BELGIUM. | - |
local.type.refereed | Refereed | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
dc.identifier.isi | A1996BG12J00018 | - |
local.bibliographicCitation.btitle | ICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS | - |
item.fulltext | No Fulltext | - |
item.contributor | CZECH, Jan | - |
item.contributor | MANCA, Jean | - |
item.contributor | Roggen J | - |
item.contributor | Huyberechts G | - |
item.contributor | STALS, Lambert | - |
item.contributor | DE SCHEPPER, Luc | - |
item.accessRights | Closed Access | - |
item.fullcitation | CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert & DE SCHEPPER, Luc (1996) Electrical characterisation and reliability studies of thick film gas sensor structures.. In: ICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS. p. 99-103.. | - |
Appears in Collections: | Research publications |
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