Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/9767
Title: Role of electron-hole pair formation in organic magnetoresistance
Authors: Majumdar, Sayani
Majumdar, Himadri S.
Aarnio, Harri
VANDERZANDE, Dirk 
Laiho, Reino
Osterbacka, Ronald
Issue Date: 2009
Publisher: AMER PHYSICAL SOC
Source: PHYSICAL REVIEW B, 79(20)
Abstract: Magnetoelectrical measurements were performed on diodes and bulk heterojunction solar cell blends (BHSCs) to clarify the role of formation of Coulombically bound electron-hole (e-h) pairs on the magnetoresistance (MR) response in organic thin-film devices. BHSCs are suitable model systems because they effectively quench excitons but the probability of forming e-h pairs in them can be tuned over orders of magnitude by the choice of material and solvent in the blend. We have systematically varied the e-h recombination coefficients, which are directly proportional to the probability for the charge carriers to meet in space, and found that a reduced probability of electrons and holes meeting in space lead to the disappearance of the MR. Our results clearly show that MR is a direct consequence of the e-h pair formation. We also found that the MR line shape follows a power-law dependence of B-0.5 at higher fields.
Notes: [Majumdar, Sayani; Majumdar, Himadri S.; Aarnio, Harri; Osterbacka, Ronald] Abo Akad Univ, Dept Phys, SF-20500 Turku, Finland. [Majumdar, Sayani; Majumdar, Himadri S.; Aarnio, Harri; Osterbacka, Ronald] Abo Akad Univ, CoE Funct Mat, SF-20500 Turku, Finland. [Majumdar, Sayani; Laiho, Reino] Univ Turku, Wihuri Phys Lab, Turku 20014, Finland. [Vanderzande, Dirk] Univ Hasselt, Div Chem, Inst Mat Res, B-3590 Diepenbeek, Belgium.
Keywords: electron-hole recombination; magnetoresistance; magnetoresistive devices; organic light emitting diodes; radiation quenching; solar cells; thin film devices; tuning
Document URI: http://hdl.handle.net/1942/9767
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.79.201202
ISI #: 000266501500008
Category: A1
Type: Journal Contribution
Validations: ecoom 2010
Appears in Collections:Research publications

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