Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/9834
Title: Thin film magnetoelectric composites near spin reorientation transition
Authors: Tiercelin, N.
Preobrazhensky, V.
MORTET, Vincent 
Talbi, A.
Soltani, Ali
HAENEN, Ken 
Pernod, D.
Issue Date: 2009
Publisher: ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Source: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 321(11). p. 1803-1807
Abstract: We report the use of a magnetic instability of the spin reorientation transition type to enhance the magnetoelectric sensitivity in magnetostrictive-piezoelectric structures. We present the theoretical study of a clamped beam resonant actuator composed of a piezoelectric element on a passive substrate actuated by a magnetostrictive nanostructured layer. The experiments were made on a polished 150 mm thick 18 x 3 mm(2) lead zirconate titanate (PZT) plate glued to a 50 mm thick silicon plate and coated with a giant magnetostrictive nanostructured Nx(TbCo2 5nm/FeCo5nm) layer. A second set of experiments was done with magnetostrictive layer deposited on PZT plate. Finally, a film/film structure using magnetostrictive and aluminium nitride films on silicon substrate was realized, and showed ME amplitudes reaching 30 V Oe(-1) cm(-1). Results agree with analytical theory.
Keywords: DYNAMICS;MEMS;Stress mediated magnetoelectric effect;Thin film;Nanostructured magnetostrictive multilayer;Spin reorientation transition
Document URI: http://hdl.handle.net/1942/9834
ISSN: 0304-8853
e-ISSN: 1873-4766
DOI: 10.1016/j.jmmm.2009.02.026
ISI #: 000265238600029
Category: A1
Type: Journal Contribution
Validations: ecoom 2010
Appears in Collections:Research publications

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