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http://hdl.handle.net/1942/24007| Title: | Radiation dosimetry properties of smartphone CMOS sensors | Authors: | Van Hoey, Olivier Salavrakos, Alexia Marques, Antonio Nagao, Alexandre Willems, Ruben Vanhavere, Filip Cauwels, Vanessa Nascimento, Luana F. |
Issue Date: | 2016 | Source: | RADIATION PROTECTION DOSIMETRY, 168(3), p. 314-321 | Abstract: | During the past years, several smartphone applications have been developed for radiation detection. These applications measure radiation using the smartphone camera complementary metal-oxide-semiconductor sensor. They are potentially useful for data collection and personal dose assessment in case of a radiological incident. However, it is important to assess these applications. Six applications were tested by means of irradiations with calibrated X-ray and gamma sources. It was shown that the measurement stabilises only after at least 10-25 min. All applications exhibited a flat dose rate response in the studied ambient dose equivalent range from 2 to 1000 mu Sv h(-1). Most applications significantly over- or underestimate the dose rate or are not calibrated in terms of dose rate. A considerable energy dependence was observed below 100 keV but not for the higher energy range more relevant for incident scenarios. Photon impact angle variation gave a measured signal variation of only about 10 %. | Document URI: | http://hdl.handle.net/1942/24007 | ISSN: | 0144-8420 | e-ISSN: | 1742-3406 | DOI: | 10.1093/rpd/ncv352 | ISI #: | 000371608200003 | Rights: | (c) The Author 2015. Published by Oxford University Press. All rights reserved | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2017 |
| Appears in Collections: | Research publications |
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|---|---|---|---|---|
| 10.1093@rpd@ncv352.pdf Restricted Access | Published version | 486.17 kB | Adobe PDF | View/Open Request a copy |
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