DE CEUNINCK, Ward

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DE CEUNINCK, Ward

ward.deceuninck@uhasselt.be

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Date Issued: 2004

Type: Journal Contribution

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		Issue Date	Title	Contributor(s)	Type	Cat.
	1	2004	MTF test system with AC based dynamic joule correction for electromigration tests on interconnects	BIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc	Journal Contribution	A1
	2	2004	Evidence for source side injection hot carrier effects on lateral DMOS transistors	ARESU, Stefano; DE CEUNINCK, Ward; Van den Bosch, G; Groeseneken, G; Moens, P.; MANCA, Jean; Wojciechowski, D; Gassot, P	Journal Contribution	A1