LEKENS, Geert

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Full Name
LEKENS, Geert
Email
geert.lekens@uhasselt.be
 
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Publications

Refined By:
Internal UHasselt:  D'HAEN, Jan
Date Issued:  [2010 TO 2011]

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Issue DateTitleContributor(s)TypeCat.
12011In situ synchrotron based x-ray fluorescence and scattering measurements during atomic layer deposition : Initial growth of HfO2 on Si and Ge substratesDevloo-Casier, Kilian; Dendooven, Jolien; Ludwig, K.F.; LEKENS, Geert; D'HAEN, Jan; Detavernier, ChristopheJournal ContributionA1