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Results 1-9 of 9 (Search time: 0.005 seconds).

Issue DateTitleContributor(s)TypeCat.
12011In situ synchrotron based x-ray fluorescence and scattering measurements during atomic layer deposition : Initial growth of HfO2 on Si and Ge substratesDevloo-Casier, Kilian; Dendooven, Jolien; Ludwig, K.F.; LEKENS, Geert; D'HAEN, Jan; Detavernier, ChristopheJournal ContributionA1
22007Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.Proceedings PaperC1
32007Lifetime modeling of intrinsic gate oxide breakdown at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, JanJournal ContributionA1
42005Failure mechanisms and qualification testing of passive componentsPost, H.A.; Letullier, P.; Briolat, T.; Humke, R.; Schuhmann, R.; Saarinen, K.; Werner, W.; Ousten, Y.; LEKENS, Geert; Dehbi, A.; Wondrak, W.Journal ContributionA1
52003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.Proceedings PaperC2
62003Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesivesLEKENS, Geert; DREESEN, Raf; CROES, Kristof; Caers, J.F.J.M.; Zhao, X.J.; Wong, E.H.Proceedings PaperC2
72003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, EJournal ContributionA1
81999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
91998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution