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http://hdl.handle.net/1942/936
Title: | Failure mechanisms and qualification testing of passive components | Authors: | Post, H.A. Letullier, P. Briolat, T. Humke, R. Schuhmann, R. Saarinen, K. Werner, W. Ousten, Y. LEKENS, Geert Dehbi, A. Wondrak, W. |
Issue Date: | 2005 | Publisher: | PERGAMON-ELSEVIER SCIENCE LTD | Source: | Microelectronics Reliability, 45(9-10). p. 1626-1632 | Abstract: | New electronic architectures and mechatronic integration in automotive and oil-field applications lead to increasing requirements concerning operating temperatures and vibration levels. At the same time, reliability and lifetime have to fulfil strong demands. In the European funded project PROCURE (Program for the development of passive devices used in rough environments) a generic spectrum of passive components needed for electronic control units has been developed. The failure mechanisms, the technological challenges, and the test requirements are highlighted below. | Keywords: | Reliability of electronic components | Document URI: | http://hdl.handle.net/1942/936 | ISSN: | 0026-2714 | e-ISSN: | 1872-941X | DOI: | 10.1016/j.microrel.2005.07.085 | ISI #: | 000232253500066 | Category: | A1 | Type: | Journal Contribution |
Appears in Collections: | Research publications |
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File | Description | Size | Format | |
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704 Microelectr. Reliab. LEKG.pdf | 45.24 kB | Adobe PDF | View/Open |
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