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|Title:||Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices||Authors:||Soussan, P.
DE CEUNINCK, Ward
|Issue Date:||2003||Source:||Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003.||Document URI:||http://hdl.handle.net/1942/4794||Category:||C2||Type:||Proceedings Paper|
|Appears in Collections:||Research publications|
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