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http://hdl.handle.net/1942/4794| Title: | Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices | Authors: | Soussan, P. LEKENS, Geert DREESEN, Raf DE CEUNINCK, Ward Beyne, E. |
Issue Date: | 2003 | Source: | Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003. | Document URI: | http://hdl.handle.net/1942/4794 | Category: | C2 | Type: | Proceedings Paper |
| Appears in Collections: | Research publications |
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