Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4794
Title: Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices
Authors: Soussan, P.
LEKENS, Geert 
DREESEN, Raf 
DE CEUNINCK, Ward 
Beyne, E.
Issue Date: 2003
Source: Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2003), Bordeaux-Arcachon, France, 6-10 October 2003.
Document URI: http://hdl.handle.net/1942/4794
Category: C2
Type: Proceedings Paper
Appears in Collections:Research publications

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