DREESEN, Raf

Full Name
DREESEN, Raf
Email
raf.dreesen@uhasselt.be
 
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Publications

Results 1-10 of 10 (Search time: 0.002 seconds).

Issue DateTitleAuthor(s)TypeCat.
12003Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesivesLEKENS, Geert ; DREESEN, Raf ; CROES, Kristof ; Caers, J.F.J.M.; Zhao, X.J.; Wong, E.H.Proceedings PaperC2
22003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert ; DREESEN, Raf ; DE CEUNINCK, Ward ; Beyne, EJournal ContributionA1
32003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert ; DREESEN, Raf ; DE CEUNINCK, Ward ; Beyne, E.Proceedings PaperC2
42002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano ; DE CEUNINCK, Ward ; DREESEN, Raf ; CROES, Kristof ; ANDRIES, Ellen ; MANCA, Jean ; DE SCHEPPER, Luc ; DEGRAEVE, Maria ; Kaczer, B.; D'OLIESLAEGER, Marc ; D'HAEN, Jan Journal ContributionA1
52002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen ; DREESEN, Raf ; CROES, Kristof ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc ; D'HAEN, Jan Journal ContributionA1
62001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof ; DREESEN, Raf ; MANCA, Jean ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Tielemans, L; Van der Wel, PJournal ContributionA1
72001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf ; CROES, Kristof ; MANCA, Jean ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Pergoot, A; Groeseneken, GJournal ContributionA1
82000Modelling of the Hot-Carrier Degradation Behaviour of Submicron nMOSFETs making use of High-Resolution MeasurementsDREESEN, Raf Theses and DissertationsT1
91999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf ; CROES, Kristof ; MANCA, Jean ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Pergoot, A; Groeseneken, GJournal Contribution
101997A high resolution method for measuring hot carrier degradation in matched transistor pairsDREESEN, Raf ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Groeseneken, G.Proceedings Paper