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http://hdl.handle.net/1942/7225| Title: | A high resolution method for measuring hot carrier degradation in matched transistor pairs | Authors: | DREESEN, Raf DE CEUNINCK, Ward DE SCHEPPER, Luc Groeseneken, G. |
Issue Date: | 1997 | Source: | Proceedings of the 8th European symposium on reliability of electron devices, failure physics and analysis. p. 1533-1536. | Document URI: | http://hdl.handle.net/1942/7225 | Type: | Proceedings Paper |
| Appears in Collections: | Research publications |
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