VLEKKEN,

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VLEKKEN,
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Date Issued:  1998

Results 1-6 of 6 (Search time: 0.002 seconds).

Issue DateTitleContributor(s)TypeCat.
11998Kwantificatie van hoofdelementen met behulp van moleculaire ionen in secundaire ionen massaspectrometrieVLEKKEN, JohanTheses and DissertationsT1
21998Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instrumentsWU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc; DE SCHEPPER, LucProceedings Paper
31998Evaluation of the energy selection optics of Cameca IMS instruments using Fast Fourier Transforms (FFT)VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, LucProceedings Paper
41998Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
51998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, LucProceedings Paper
61998Monte Carlo simulation of the formation of M2+-molecular ions sputtered from metallic materialsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; Vandervorst, W.Proceedings Paper