DREESEN, Raf

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Full Name
DREESEN, Raf
Email
raf.dreesen@uhasselt.be
 
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Date Issued:  1997

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Issue DateTitleContributor(s)TypeCat.
11997A high resolution method for measuring hot carrier degradation in matched transistor pairsDREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.Proceedings Paper