DREESEN, Raf

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DREESEN, Raf
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raf.dreesen@uhasselt.be
 
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Date Issued:  2003
Author:  Beyne, E.

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Issue DateTitleContributor(s)TypeCat.
12003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.Proceedings PaperC2