VANSTREELS, Kris

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VANSTREELS, Kris
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kris.vanstreels@uhasselt.be
 
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Author:  BIESEMANS, Leen
Type:  Journal Contribution

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Issue DateTitleContributor(s)TypeCat.
12004MTF test system with AC based dynamic joule correction for electromigration tests on interconnectsBIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcJournal ContributionA1