DAENEN, Michael

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DAENEN, Michael
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michael.daenen@uhasselt.be
 
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Publications

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Date Issued:  [2020 TO 2022]

Results 21-29 of 29 (Search time: 0.007 seconds).

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Issue DateTitleContributor(s)TypeCat.
212020Round-robin of damp heat tests using CIGS solar cellsde Amorim Soares, Gabriela; CAROLUS, Jorne; DAENEN, Michael; Masolin, Alex; Birrenbach, Thomas; Gerber, Andreas; Wrigley, Andrew; Henzel, Jonathan; Roosen, Dorrit; MEURIS, Marc; Theelen, MirjamJournal ContributionA1
222020Why and how to adapt PID testing for bifacial PV modules?CAROLUS, Jorne; BREUGELMANS, Robbe; Tsanakas, John; VAN DER HEIDE, Arvid; Voroshazi, Eszter; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
232020Potential-Induced Degradation of the Shunting Type: on the Origin of Sodium in Shunt PathsBREUGELMANS, Robbe; CAROLUS, Jorne; VAN DER HEIDE, Arvid; Voroshazi, Eszter; DAENEN, MichaelConference MaterialC2
242020Practical Considerations for Designing Reliable DC/DC Converters, Applied to a BIPV CaseRavyts, Simon; VAN DE SANDE, Wieland; Vecchia, Mauricio; Van den Broeck, Giel; Duraij, Martijn; MARTINEZ, Wilmar; DAENEN, Michael; Driesen, JohanJournal ContributionA1
252020Precursor Design Strategies for the Low-Temperature Synthesis of Functional Oxides: It's All in the ChemistryMARCHAL, Wouter; DE SLOOVERE, Dries; DAENEN, Michael; VAN BAEL, Marlies; HARDY, AnJournal ContributionA1
262020Economic Study of Battery Profitability in Residential Solar Panel Systems: A Case Study of BelgiumALAVI, Omid; Despeghel, Jolien; DE CEUNINCK, Ward; MEURIS, Marc; Driesen, Johan; DAENEN, MichaelProceedings PaperC1
272020Influence of PV and Battery Degradation on Residential Solar Panel SystemsALAVI, Omid; DE CEUNINCK, Ward; MEURIS, Marc; DAENEN, MichaelProceedings PaperC1
282020Thermo-Mechanical Stress Comparison of a GaN and SiC MOSFET for Photovoltaic ApplicationsVAN DE SANDE, Wieland; ALAVI, Omid; NIVELLE, Philippe; D'HAEN, Jan; DAENEN, MichaelJournal ContributionA1
292020The Sensitivity of an Electro-Thermal Photovoltaic DC–DC Converter Model to the Temperature Dependence of the Electrical Variables for Reliability AnalysesVAN DE SANDE, Wieland; Ravyts, Simon; ALAVI, Omid; NIVELLE, Philippe; Driesen, Johan; DAENEN, MichaelJournal ContributionA1
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