NIVELLE, Philippe

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Full Name
NIVELLE, Philippe
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philippe.nivelle@uhasselt.be
 
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Publications

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Date Issued:  2020

Results 1-5 of 5 (Search time: 0.002 seconds).

Issue DateTitleContributor(s)TypeCat.
12020Encapsulant-Integrated Interconnection of Bifacial Solar Cells for BIPV Applications: Latest Results in the Twill-BIPV ProjectGOVAERTS, Jonathan; BORGERS, Tom; VAN DYCK, Rik; Andries, Nick; Meyers, Pieter; VAN DER HEIDE, Arvid; Vastmans, Luc; Moors, Reinoud; Doumen, Geert; NIVELLE, Philippe; DAENEN, Michael; Voroshazi, Eszter; Arnett, Chad; Labie, Riet; Van Den Storme, Manuel; Van Den Storme, Guy; Vandebroek, Steven; Schroyen, Peter; Smeers, Kris; Vavilkin, Tatjana; Dewallef, Stefan; Abgrall, Florent; Jousset, Dominique; POORTMANS, JefProceedings PaperC1
22020Layer Morphology and Ink Compatibility of Silver Nanoparticle Inkjet Inks for Near-Infrared SinteringREENAERS, Dieter; MARCHAL, Wouter; Biesmans, Ianto; NIVELLE, Philippe; D'HAEN, Jan; DEFERME, WimJournal ContributionA1
32020Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real-Time as a Tool for Sensing ApplicationsOUDEBROUCKX, Gilles; VANDENRYT, Thijs; NIVELLE, Philippe; BORMANS, Seppe; WAGNER, Patrick; THOELEN, RonaldJournal ContributionA1
42020Thermo-Mechanical Stress Comparison of a GaN and SiC MOSFET for Photovoltaic ApplicationsVAN DE SANDE, Wieland; ALAVI, Omid; NIVELLE, Philippe; D'HAEN, Jan; DAENEN, MichaelJournal ContributionA1
52020The Sensitivity of an Electro-Thermal Photovoltaic DC–DC Converter Model to the Temperature Dependence of the Electrical Variables for Reliability AnalysesVAN DE SANDE, Wieland; Ravyts, Simon; ALAVI, Omid; NIVELLE, Philippe; Driesen, Johan; DAENEN, MichaelJournal ContributionA1