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|Title:||Tracing Gold Nanoparticle Charge by Electrolyte Insulator Semiconductor Devices||Authors:||Gun, Jenny
Abouzar, Maryam H.
Schoening, Michael J.
|Issue Date:||2011||Publisher:||AMER CHEMICAL SOC||Source:||JOURNAL OF PHYSICAL CHEMISTRY C, 115 (11). p. 4439-4445||Abstract:||A capacitive field-effect electrolyte-insulator-semiconductor (EIS) device was applied for the first time to trace the charge of supported gold nanoparticles (Au-NPs) induced by oxygen plasma treatment or due to storing in aqueous oxidation and reduction solutions. In addition, X-ray photoelectron spectroscopy (XPS) has been used as a reference method to establish the various charge states of the Au-NPs resulting from the different treatment steps. After the oxygen-plasma treatment, a shift of the capacitance voltage (C-V) curve (and flatband potential) of the Au-NP-covered p-Si-SiO2 EIS structure by about -300 mV was found. The exposure of the EIS sensor surface to an oxidative and a reductive solution resulted in a shift of the C-V curve for -85 and +81 mV, respectively. These observations correlate well with corresponding binding energy shifts in Au 4f core spectra in XPS experiments. The obtained results may open new opportunities for biosensing and biochips based on nanoparticle-charge-gated field-effect devices.||Notes:||[Gun, Jenny; Gutkin, Vitaly; Lev, Ovadia] Hebrew Univ Jerusalem, Casali Inst, IL-91904 Jerusalem, Israel. [Gun, Jenny; Gutkin, Vitaly; Lev, Ovadia] Hebrew Univ Jerusalem, Inst Chem, IL-91904 Jerusalem, Israel. [Boyen, Hans-Gerd; Saitner, Marc; Wagner, Patrick; D'Olieslaeger, Marc] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Wagner, Patrick; D'Olieslaeger, Marc] IMEC, Div IMOMEC, B-3590 Diepenbeek, Belgium. [Abouzar, Maryam H.; Poghossian, Arshak; Schoening, Michael J.] Aachen Univ Appl Sci, Inst Nano & Biotechnol INB, DE-52428 Julich, Germany. [Abouzar, Maryam H.; Poghossian, Arshak; Schoening, Michael J.] Res Ctr Julich, Inst Bio & Nanosyst IBN 2, DE-52425 Julich, Germany. Jennyg@Savion.huji.ac.il; email@example.com||Document URI:||http://hdl.handle.net/1942/11854||ISSN:||1932-7447||e-ISSN:||1932-7455||DOI:||10.1021/jp109886s||ISI #:||000288401200012||Category:||A1||Type:||Journal Contribution||Validations:||ecoom 2012|
|Appears in Collections:||Research publications|
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