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Title: | Current-induced nanogap formation and graphitization in boron-doped diamond films | Authors: | Seshan, V. Arroyo, C.R. Castellanos-Gomez, A. Prins, F. Perrin, M. L. JANSSENS, Stoffel HAENEN, Ken NESLADEK, Milos Sudhoelter, E. J. R. de Smet, L. C. P. M. van der Zant, H. S. J. DULIC, Diana |
Issue Date: | 2012 | Publisher: | AMER INST PHYSICS | Source: | APPLIED PHYSICS LETTERS, 101 (19) | Abstract: | A high-current annealing technique is used to fabricate nanogaps and hybrid diamond/graphite structures in boron-doped nanocrystalline diamond films. Nanometer-sized gaps down to similar to 1 nm are produced using a feedback-controlled current annealing procedure. The nanogaps are characterized using scanning electron microscopy and electronic transport measurements. The structural changes produced by the elevated temperature, achieved by Joule heating during current annealing, are characterized using Raman spectroscopy. The formation of hybridized diamond/graphite structure is observed at the point of maximum heat accumulation. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4766346] | Notes: | Arroyo, CR (reprint author),[Seshan, V.; Arroyo, C. R.; Castellanos-Gomez, A.; Prins, F.; Perrin, M. L.; Janssens, S. D.; van der Zant, H. S. J.; Dulic, D.] Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands. [Seshan, V.; Janssens, S. D.; Sudhoelter, E. J. R.; de Smet, L. C. P. M.] Delft Univ Technol, Dept Chem Engn, NL-2628 BL Delft, Netherlands. [Haenen, K.; Nesladek, M.] Hasselt Univ, Inst Mat Res, BE-3590 Diepenbeek, Belgium. [Haenen, K.; Nesladek, M.] IMEC VZW, IMOMEC, BE-3590 Diepenbeek, Belgium. c.arroyorodriguez@tudelft.nl; a.castellanosgomez@tudelft.nl | Keywords: | annealing; boron; diamond; elemental semiconductors; energy gap; graphite; graphitisation; nanofabrication; nanostructured materials; Raman spectra; scanning electron microscopy;Physics, Applied; annealing; boron; diamond; elemental semiconductors; energy gap; graphite; graphitisation; nanofabrication; nanostructured materials; Raman spectra; scanning electron microscopy | Document URI: | http://hdl.handle.net/1942/14505 | ISSN: | 0003-6951 | e-ISSN: | 1077-3118 | DOI: | 10.1063/1.4766346 | ISI #: | 000311320100054 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2013 |
Appears in Collections: | Research publications |
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