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http://hdl.handle.net/1942/14706
Title: | Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials | Authors: | Valev, V.K. DE CLERCQ, Ben Zheng, X. Biris, C.G. Panoiu, N.C. Silhanek, A.V. Volskiy, V. Aktsipetrov, Oleg A. Vandenbosch, G.A.E. AMELOOT, Marcel Moshchalkov, V.V. Verbiest, T. |
Issue Date: | 2012 | Source: | Andrews, David L.; Nunzi, Jean-Michel; Ostendorf, Andreas (Ed.). Proceedings of SPIE (Nanophotonics IV), p. (ART N° 842411) | Series/Report: | Proceedings of SPIE | Series/Report no.: | 8424 | Abstract: | Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results. | Document URI: | http://hdl.handle.net/1942/14706 | ISBN: | 9780819491169 | DOI: | 10.1117/12.922880 | ISI #: | 000305699700017 | Category: | C1 | Type: | Proceedings Paper | Validations: | ecoom 2014 |
Appears in Collections: | Research publications |
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VK-Valev,-et-al,-Proc-of-SPIE-8424-842411.pdf Restricted Access | Published version | 9.53 MB | Adobe PDF | View/Open Request a copy |
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