Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/1585
Title: Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy
Authors: DOUHERET, Olivier 
LUTSEN, Laurence 
SWINNEN, Ann 
BRESELGE, Martin 
VANDEWAL, Koen 
GORIS, Ludwig 
MANCA, Jean 
Issue Date: 2006
Publisher: American Institute of Physics
Source: APPLIED PHYSICS LETTERS, 89(3). p. 032107-...
Abstract: Conductive atomic force microscopy (CAFM) is introduced to perform electrical characterization of organic photovoltaic blends with high spatial resolution. Reference blends used in organic bulk heterojunction solar cells are investigated. The ability of CAFM to electrically evidence phase separated donor and acceptor regions is demonstrated. Furthermore, local spectroscopy is performed to analyze charge transport mechanisms in the blends. Significant modifications of the electrical properties of the semiconducting polymers are shown to occur after blending with fullerene derivatives. Finally, the sensitivity of CAFM to photoelectrical phenomena is revealed. Current variations of few picoamperes are locally observed under illumination of P3HT
Document URI: http://hdl.handle.net/1942/1585
ISSN: 0003-6951
e-ISSN: 1077-3118
DOI: 10.1063/1.2227846
ISI #: 000239174100058
Category: A1
Type: Journal Contribution
Validations: ecoom 2007
Appears in Collections:Research publications

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