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Title: High-order wavelets for hierarchical refinement in inverse rendering
Other Titles: In ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages
Authors: MICHIELS, Nick 
PUT, Jeroen 
Klaudiny, Martin
BEKAERT, Philippe 
Issue Date: 2013
Publisher: ACM
Source: ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages
Abstract: It is common to use factored representation of visibility, lighting and BRDF in inverse rendering. Current techniques use Haar wavelets to calculate these triple product integrals efficiently [Ng et al. 2004]. Haar wavelets are an ideal basis for the piecewise constant visibility function, but suboptimal for the smoother lighting and material functions. How can we leverage compact high-order wavelet bases to improve efficiency, memory consumption and accuracy of an inverse rendering algorithm? If triple product integrals can be efficiently calculated for higher-order wavelets, the reduction in coefficients will reduce the number of calculations, therefore improving performance and memory usage. Some BRDFs can be stored five times more compactly.
Notes: Poster publication
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ISBN: 978-1-4503-2342-0
DOI: 10.1145/2503385.2503494
Category: C2
Type: Proceedings Paper
Appears in Collections:Research publications

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