Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/16014
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMICHIELS, Nick-
dc.contributor.authorPUT, Jeroen-
dc.contributor.authorHABER, Tom-
dc.contributor.authorKlaudiny, Martin-
dc.contributor.authorBEKAERT, Philippe-
dc.date.accessioned2013-11-22T09:17:08Z-
dc.date.available2013-11-22T09:17:08Z-
dc.date.issued2013-
dc.identifier.citationACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages-
dc.identifier.isbn978-1-4503-2342-0-
dc.identifier.urihttp://hdl.handle.net/1942/16014-
dc.description.abstractIt is common to use factored representation of visibility, lighting and BRDF in inverse rendering. Current techniques use Haar wavelets to calculate these triple product integrals efficiently [Ng et al. 2004]. Haar wavelets are an ideal basis for the piecewise constant visibility function, but suboptimal for the smoother lighting and material functions. How can we leverage compact high-order wavelet bases to improve efficiency, memory consumption and accuracy of an inverse rendering algorithm? If triple product integrals can be efficiently calculated for higher-order wavelets, the reduction in coefficients will reduce the number of calculations, therefore improving performance and memory usage. Some BRDFs can be stored five times more compactly.-
dc.language.isoen-
dc.publisherACM-
dc.titleHigh-order wavelets for hierarchical refinement in inverse rendering-
dc.title.alternativeIn ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages-
dc.typeProceedings Paper-
local.bibliographicCitation.conferencedate21-15/07/2013-
local.bibliographicCitation.conferencenameACM SIGGRAPH 2013 - Posters(SIGGRAPH '13)-
local.bibliographicCitation.conferenceplaceAnaheim-
dc.identifier.spageArticle 99-
local.format.pages1-
local.bibliographicCitation.jcatC2-
dc.description.notesPoster publication-
local.publisher.placeNew York, NY, USA-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
dc.identifier.doi10.1145/2503385.2503494-
local.bibliographicCitation.btitleACM SIGGRAPH 2013 Posters(SIGGRAPH '13).-
item.accessRightsOpen Access-
item.contributorMICHIELS, Nick-
item.contributorPUT, Jeroen-
item.contributorHABER, Tom-
item.contributorKlaudiny, Martin-
item.contributorBEKAERT, Philippe-
item.fulltextWith Fulltext-
item.fullcitationMICHIELS, Nick; PUT, Jeroen; HABER, Tom; Klaudiny, Martin & BEKAERT, Philippe (2013) High-order wavelets for hierarchical refinement in inverse rendering. In: ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages.-
Appears in Collections:Research publications
Show simple item record

SCOPUSTM   
Citations

1
checked on Sep 3, 2020

Page view(s)

110
checked on Aug 26, 2023

Download(s)

242
checked on Aug 26, 2023

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.