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http://hdl.handle.net/1942/16014
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DC Field | Value | Language |
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dc.contributor.author | MICHIELS, Nick | - |
dc.contributor.author | PUT, Jeroen | - |
dc.contributor.author | HABER, Tom | - |
dc.contributor.author | Klaudiny, Martin | - |
dc.contributor.author | BEKAERT, Philippe | - |
dc.date.accessioned | 2013-11-22T09:17:08Z | - |
dc.date.available | 2013-11-22T09:17:08Z | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages | - |
dc.identifier.isbn | 978-1-4503-2342-0 | - |
dc.identifier.uri | http://hdl.handle.net/1942/16014 | - |
dc.description.abstract | It is common to use factored representation of visibility, lighting and BRDF in inverse rendering. Current techniques use Haar wavelets to calculate these triple product integrals efficiently [Ng et al. 2004]. Haar wavelets are an ideal basis for the piecewise constant visibility function, but suboptimal for the smoother lighting and material functions. How can we leverage compact high-order wavelet bases to improve efficiency, memory consumption and accuracy of an inverse rendering algorithm? If triple product integrals can be efficiently calculated for higher-order wavelets, the reduction in coefficients will reduce the number of calculations, therefore improving performance and memory usage. Some BRDFs can be stored five times more compactly. | - |
dc.language.iso | en | - |
dc.publisher | ACM | - |
dc.title | High-order wavelets for hierarchical refinement in inverse rendering | - |
dc.title.alternative | In ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages | - |
dc.type | Proceedings Paper | - |
local.bibliographicCitation.conferencedate | 21-15/07/2013 | - |
local.bibliographicCitation.conferencename | ACM SIGGRAPH 2013 - Posters(SIGGRAPH '13) | - |
local.bibliographicCitation.conferenceplace | Anaheim | - |
dc.identifier.spage | Article 99 | - |
local.format.pages | 1 | - |
local.bibliographicCitation.jcat | C2 | - |
dc.description.notes | Poster publication | - |
local.publisher.place | New York, NY, USA | - |
local.type.refereed | Refereed | - |
local.type.specified | Proceedings Paper | - |
dc.identifier.doi | 10.1145/2503385.2503494 | - |
local.bibliographicCitation.btitle | ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). | - |
item.accessRights | Open Access | - |
item.contributor | MICHIELS, Nick | - |
item.contributor | PUT, Jeroen | - |
item.contributor | HABER, Tom | - |
item.contributor | Klaudiny, Martin | - |
item.contributor | BEKAERT, Philippe | - |
item.fulltext | With Fulltext | - |
item.fullcitation | MICHIELS, Nick; PUT, Jeroen; HABER, Tom; Klaudiny, Martin & BEKAERT, Philippe (2013) High-order wavelets for hierarchical refinement in inverse rendering. In: ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages. | - |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
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poster_highOrderWaveletsForHierarchicalRefineMentInInverseRendering_SIGG2013.pdf | 1.78 MB | Adobe PDF | View/Open | |
abstract_highOrderWaveletsForHierarchicalRefineMentInInverseRendering_SIGG2013.pdf | 1.7 MB | Adobe PDF | View/Open |
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