Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/16014
Title: High-order wavelets for hierarchical refinement in inverse rendering
Other Titles: In ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages
Authors: MICHIELS, Nick 
PUT, Jeroen 
HABER, Tom 
Klaudiny, Martin
BEKAERT, Philippe 
Issue Date: 2013
Publisher: ACM
Source: ACM SIGGRAPH 2013 Posters(SIGGRAPH '13). ACM, New York, NY, USA, , Article 99 , 1 pages
Abstract: It is common to use factored representation of visibility, lighting and BRDF in inverse rendering. Current techniques use Haar wavelets to calculate these triple product integrals efficiently [Ng et al. 2004]. Haar wavelets are an ideal basis for the piecewise constant visibility function, but suboptimal for the smoother lighting and material functions. How can we leverage compact high-order wavelet bases to improve efficiency, memory consumption and accuracy of an inverse rendering algorithm? If triple product integrals can be efficiently calculated for higher-order wavelets, the reduction in coefficients will reduce the number of calculations, therefore improving performance and memory usage. Some BRDFs can be stored five times more compactly.
Notes: Poster publication
Document URI: http://hdl.handle.net/1942/16014
ISBN: 978-1-4503-2342-0
DOI: 10.1145/2503385.2503494
Category: C2
Type: Proceedings Paper
Appears in Collections:Research publications

Show full item record

SCOPUSTM   
Citations

1
checked on Sep 3, 2020

Page view(s)

110
checked on Aug 26, 2023

Download(s)

242
checked on Aug 26, 2023

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.