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http://hdl.handle.net/1942/2106
Title: | Pitfalls and their remedies in time-resolved fluorescence spectroscopy and microscopy | Authors: | VAN DE VEN, Martin AMELOOT, Marcel Valeur, B Boens, N |
Issue Date: | 2005 | Publisher: | SPRINGER/PLENUM PUBLISHERS | Source: | JOURNAL OF FLUORESCENCE, 15(3). p. 377-413 | Abstract: | Time-resolved fluorescence spectroscopy and microscopy in both time and frequency domains provide very useful and accurate information on dynamic processes. Good quality data are essential in obtaining reliable parameter estimates. Distortions of the fluorescence response due to artifacts may have disastrous consequences. We provide here a concise overview of potential difficulties encountered under daily laboratory circumstances in the use of time- and frequency-domain equipment as well as practical remedies against common error conditions, elucidated with several graphs to aid the researcher in visual inspection and quality-control of collected data. A range of artifacts due to sample preparation or to optical and electronic pitfalls are discussed, as are remedies against them. Also recommended data analysis strategies are described. | Notes: | Katholieke Univ Leuven, Dept Chem, B-3001 Heverlee, Belgium. Transnatl Univ Limburg, Biomed Onderzoeksinst, Limburgs Univ Ctr, Sch Life Sci, B-3590 Diepenbeek, Belgium. Conservatoire Natl Arts & Metiers, CNRS, UMR 8531, Lab Chim Gen, F-75141 Paris, France. ENS Cachan, CNRS, UMR 8531, Lab PPSM, F-94235 Cachan, France.Boens, N, Katholieke Univ Leuven, Dept Chem, Celestijnenlaan 200 F, B-3001 Heverlee, Belgium.noel.boens@chem.kuleuven.be | Keywords: | time-resolved fluorescence spectroscopy; time-resolved fluorescence microscopy; artifacts; pulse fluorometry; phase-modulation fluorometry; FLIM; single-photon timing; sample preparation; optics; electronics; data analysis | Document URI: | http://hdl.handle.net/1942/2106 | ISSN: | 1053-0509 | e-ISSN: | 1573-4994 | DOI: | 10.1007/s10895-005-2632-1 | ISI #: | 000230175600014 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2006 |
Appears in Collections: | Research publications |
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