Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2329
Title: Fourier transform photocurrent spectroscopy of dopants and defects in CVD diamond
Authors: Vanecek, M
Kravets, R
Poruba, A
Rosa, J
NESLADEK, Milos 
Koizumi, S
Issue Date: 2003
Publisher: ELSEVIER SCIENCE SA
Source: DIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525
Abstract: Fourier-transform photocurrent spectroscopy (FrPS) was used as a very sensitive spectroscopic method to detect shallow and deep impurities (dopants) in CVD diamond layers. Detailed study of experimental conditions (temperature, frequency, electric field, bias light, surface conditions) was performed. Residual boron contamination was detected in many samples, phosphorus spectra were measured in P doped epitaxial layers. Anomalous (opposite) temperature dependence of the defect level with a threshold approximately 0.9 eV was detected and possible explanation of this effect was discussed. (C) 2002 Elsevier Science B.V. All rights reserved.
Notes: Acad Sci Czech Republ, Inst Phys, CZ-16200 Prague 6, Czech Republic. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium. Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Prague 6, Czech Republic.
Keywords: CVD diamond; doping; defects; photocurrent spectroscopy
Document URI: http://hdl.handle.net/1942/2329
ISSN: 0925-9635
e-ISSN: 1879-0062
DOI: 10.1016/S0925-9635(02)00347-3
ISI #: 000182872000056
Category: A1
Type: Journal Contribution
Validations: ecoom 2004
Appears in Collections:Research publications

Show full item record

SCOPUSTM   
Citations

16
checked on Sep 2, 2020

WEB OF SCIENCETM
Citations

17
checked on May 22, 2022

Page view(s)

56
checked on May 25, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.