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http://hdl.handle.net/1942/2329
Title: | Fourier transform photocurrent spectroscopy of dopants and defects in CVD diamond | Authors: | Vanecek, M Kravets, R Poruba, A Rosa, J NESLADEK, Milos Koizumi, S |
Issue Date: | 2003 | Publisher: | ELSEVIER SCIENCE SA | Source: | DIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525 | Abstract: | Fourier-transform photocurrent spectroscopy (FrPS) was used as a very sensitive spectroscopic method to detect shallow and deep impurities (dopants) in CVD diamond layers. Detailed study of experimental conditions (temperature, frequency, electric field, bias light, surface conditions) was performed. Residual boron contamination was detected in many samples, phosphorus spectra were measured in P doped epitaxial layers. Anomalous (opposite) temperature dependence of the defect level with a threshold approximately 0.9 eV was detected and possible explanation of this effect was discussed. (C) 2002 Elsevier Science B.V. All rights reserved. | Notes: | Acad Sci Czech Republ, Inst Phys, CZ-16200 Prague 6, Czech Republic. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium. Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Prague 6, Czech Republic. | Keywords: | CVD diamond; doping; defects; photocurrent spectroscopy | Document URI: | http://hdl.handle.net/1942/2329 | ISSN: | 0925-9635 | e-ISSN: | 1879-0062 | DOI: | 10.1016/S0925-9635(02)00347-3 | ISI #: | 000182872000056 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2004 |
Appears in Collections: | Research publications |
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