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Title: | Irreversible damage at high levels of potential-induced degradation on photovoltaic modules | Authors: | CAROLUS, Jorne DE CEUNINCK, Ward DAENEN, Michael |
Issue Date: | 2017 | Publisher: | IEEE | Source: | IRPS'17: Proceedings of 55th IEEE International Reliability Physics Symposium, 2017, IEEE, | Series/Report: | International Reliability Physics Symposium | Abstract: | Potential-induced degradation (PID) of photovoltaic (PV) modules gets a lot of attention since 2010 when Solon published their findings about a degradation mechanism in their PV modules caused by high potential differences between the solar cell and the grounded frame. Module level efficiency drops of 30% and more caused by PID have been reported. A stress test for PID according to IEC 62804 and a recovery test in the same conditions were conducted on a set of 49 commercially available PV modules. In this paper we report the irreversibility of highly affected (i.e. over 85% PID) PV modules. From this point of view, it is important to detect and recover PID before the point of no return. Furthermore, the impact of PID on the different parameters of a PV module and their relevance in order to detect PID in the field are reported. | Notes: | Carolus, J (reprint author), Hasselt Univ, Martelarenlaan 42, B-3500 Hasselt, Belgium. jorne.carolus@uhasselt.be | Keywords: | High Voltage Stress (HVS); photovoltaic (PV) modules; Potential-Induced Degradation (PID); reliability; Test Campaign | Document URI: | http://hdl.handle.net/1942/23327 | ISBN: | 9781509066414 | DOI: | 10.1109/IRPS.2017.7936275 | ISI #: | 000416068500023 | Category: | C1 | Type: | Proceedings Paper | Validations: | ecoom 2018 |
Appears in Collections: | Research publications |
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PID1191560.pdf Restricted Access | Peer-reviewed author version | 492.8 kB | Adobe PDF | View/Open Request a copy |
document.pdf Restricted Access | Published version | 556.46 kB | Adobe PDF | View/Open Request a copy |
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