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http://hdl.handle.net/1942/2402| Title: | On the atomistic details of electromigration-induced drift | Authors: | Proost, J D'HAEN, Jan Jin, M Verlinden, B |
Issue Date: | 2004 | Publisher: | PERGAMON-ELSEVIER SCIENCE LTD | Source: | SCRIPTA MATERIALIA, 50(2). p. 267-271 | Abstract: | Electromigration drift studies have been performed inside a SEM. Based on the observed drift mode, a grain boundary grooving model is proposed to account for the atomistic details of current-induced motion. The role of grain boundary structure in determining the local direction of groove propagation is illustrated. (C) 2003 Published by Elsevier Ltd. on behalf of Acta Materialia Inc. | Notes: | Dept Met & Mat Engn, B-3001 Louvain, Belgium. IMOMEC, B-3590 Diepenbeek, Belgium.Proost, J, Dept Met & Mat Engn, Kasteelpk Arenberg 44, B-3001 Louvain, Belgium. | Keywords: | electromigration; thin films; kinetics; grain boundary structure | Document URI: | http://hdl.handle.net/1942/2402 | ISSN: | 1359-6462 | e-ISSN: | 1872-8456 | DOI: | 10.1016/j.scriptamat.2003.10.005 | ISI #: | 000186377200016 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2004 |
| Appears in Collections: | Research publications |
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