Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2406
Title: The phosphorous level fine structure in homoepitaxial and polycrystalline n-type CVD diamond
Authors: HAENEN, Ken 
NESLADEK, Milos 
DE SCHEPPER, Luc 
Kravets, R
Vanecek, M
Koizumi, S
Issue Date: 2004
Publisher: ELSEVIER SCIENCE SA
Source: DIAMOND AND RELATED MATERIALS, 13(11-12). p. 2041-2045
Abstract: The application of very sensitive photocurrent-based spectroscopic techniques have led to the detection of new levels for the electronic structure of the phosphorous donor in n-type CVD diamond. By combining quasi-steady-state photocurrent measurements (PC), photothermal ionisation spectroscopy (PTIS) and the highly sensitive Fourier transform photocurrent spectroscopy (FTPS) technique at different temperatures, ranging from liquid nitrogen temperature to 170 K, the resulting spectra point to a richer structure than assumed up to now. This is the consequence of the improved sample quality over the last years, opening up to a much larger attainable doping window. By using doping levels, ranging from 10(19) cm(-3) down to 10(16) cm(-3) on { 111 }-oriented Ib. HPHT substrates, still giving rise to measurable n-type conductivity, spectra showed less line broadening and more fine structure. Finally, the results will be compared with spectra measured on active P-doped polycrystalline n-type films. (C) 2004 Elsevier B.V. All rights reserved.
Notes: Limburgs Univ Ctr, IMO, B-3590 Diepenbeek, Belgium. NIMS, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan. IMEC Vzw, Div IMOMEC, B-3590 Diepenbeek, Belgium. Acad Sci Czech Republ, Inst Phys, CZ-16253 Prague 6, Czech Republic.Haenen, K, Limburgs Univ Ctr, IMO, Wetenschapspark 1, B-3590 Diepenbeek, Belgium.ken.haenen@luc.ac.be
Keywords: n-type doping; phosphorous; opto-electronic characterisation; electronic structure
Document URI: http://hdl.handle.net/1942/2406
ISSN: 0925-9635
e-ISSN: 1879-0062
DOI: 10.1016/j.diamond.2004.06.016
ISI #: 000225057300023
Category: A1
Type: Journal Contribution
Validations: ecoom 2005
Appears in Collections:Research publications

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